Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature.

The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability.  Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Preface

Part 1: Materials Issues and Reliability of Optical Devices
1. Reliability Testing of Semiconductor Optical Devices
2. Failure Analysis of Semiconductor Optical Devices
3. Failure Analysis using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
5. Catastrophic Optical-damage in High Power, Broad-Area Laser-diodes
6. Reliability and Degradation of Vertical Cavity Surface Emitting Lasers
7. Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes
8. InGaN Laser Diode Degradation
9. Radiation-enhanced Dislocation Glide - The Current Status of Research
10. Mechanism of Defect Reactions in Semiconductors

Part 2: Materials Issues and Reliability of Electron Devices
11. Reliability Studies in the Real World
12. Strain Effects in AlGaN/GaN HEMTs
13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
15. Novel Dielectrics for GaN Device Passivation And Improved Reliability
16. Reliability Simulation
17. The Analysis of Wide Bandgap Semiconductors Using Raman Spectroscopy
18. Reliability Study of InP-Based HBTs Operating at High Current Density
Index