Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Dieses Buch, das aus dem erfolgreichen dreibändigen Handbook of Microscopy hervorging, gewährt einen breiten Überblick über die physikalischen Grundlagen und Prinzipien aller modernen Techniken der Elktronenmikroskopie. Diese Kompendium der am weitesten verbreiteten Methode zur Oberflächencharakterisierung bietet einen kompetenten Vergleich der neuesten Entwicklungen in diesem hochaktuellen Gebiet.Behandelt werden unter anderem:* Stationary Beam Methods: Transmission Electron Microscopy /Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/ Electron Holographic Methods* Scanning Beam Methods: /Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass SpectrometryDas Werk richtet sich gleichermaßen an Materialwissenschaftler, Oberfächenchemiker und -physiker , die mehr über die Prinzipien der Elektronenmikroskopie wissen wollen.

STATIONARY BEAM METHODSTransmission Electron MicroscopyReflection Electro MicroscopyElectron Energy Loss SpectroscopyHigh-Voltage Electron MicroscopyConvergent Electron Beam DiffractionLow Energy Electron MicroscopyLorentz MicroscopyElectron holographic MethodsSCANNING BEAM METHODSScanning Reflection Electron MicroscopyScanning Transmission Electron MicroscopyScanning Transmission Electron Microscopy: Z-ContrastScanning Auger and XPS MicroscopyScanning MicroanalysisImaging Secondary Ion Mass Spectrometry