The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

ForewordPrefaceIntroduction to CAFM: History, Experimental and Current StatusReliability of Polycrystalline Thin Oxides and InsulatorsInvestigation of High-k Dielectric Stacks by TUNA and CAFM: Advantages, Limitations and Applications3D Tomography for Analyzing Conductive Filaments for Resistive Random Access Memory DevicesCAFM Applications for Energy Efficient and High-Frequency ElectronicsLocal Anodic Oxidation with AFM TipsCAFM Studies of Low-Dimensional MaterialsDesign of a Logarithmic Amplifier for CAFMResiscopes for Analyzing Wide Dynamic Current RangesCombination of CAFM with the Probestation for Characterization of Resistive Switching and Channel Hot Carriers Degradation in FETsMultiprobe CAFMScanning Capacitance Microscopy as a Complementary Tool for CAFMKPFM and its Use to Characterize the CPD in Different MaterialsHot-Electron Nanoscopy Using Adiabatic Compression of Surface PlasmonsFabrication and Reliability of AFM Nanoprobes