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Theory and Practice of Quality and Reliability Engineering in Asia Industry

This book discusses the application of quality and reliability engineering in Asian industries, a...

Graphene and VLSI Interconnects

Copper (Cu) has been used as an interconnection material in the semiconductor industry for years ...

Electromigration Modeling at Circuit Layout Level

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where t...

ELECTROMIGRATION IN ULSI INTERCONNECTI..

Reliability and Failure Analysis of High-Power LED Packaging

Reliability and Failure Analysis of High-Power LED Packaging provides fundamental understanding o...

Future Learning in Primary Schools

This edited book tells the story of the multifaceted efforts devoted by a "e;future school&qu...

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections...

Graphene and VLSI Interconnects

Copper (Cu) has been used as an interconnection material in the semiconductor industry for years ...

Electromigration In Ulsi Interconnections

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigr...