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  1. Surface and Interface Characterization by Electron Optical Methods
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    Surface and Interface Characterization by Electron Optical Methods

    Ugo Valdre
    Springer US
    Ebook
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    The importance of real space imaging and spatially-resolved spectroscopy in many of the most sign...

    Unser bisheriger Preis:ORGPRICE: 56,35 €

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  2. Impact of Electron and Scanning Probe Microscopy on Materials Research
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    Impact of Electron and Scanning Probe Microscopy on Materials Research

    David G. Rickerby
    Springer Netherlands
    Ebook
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    The Advanced Study Institute provided an opportunity for researchers in universities, industry an...

    Unser bisheriger Preis:ORGPRICE: 111,04 €

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  3. Surface and Interface Characterization by Electron Optical Methods

    Surface and Interface Characterization by Electron Optical Methods

    Ugo Valdre
    Springer US
    Taschenbuch
    Print on Demand

    The importance of real space imaging and spatially-resolved spectroscopy in many of the most sign...

    85,55 €
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