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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Manoj Sachdev
    Springer US
    Ebook
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    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Unser bisheriger Preis:ORGPRICE: 224,43 €

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  2. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
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    Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    Jose Pineda de Gyvez
    Springer US
    Ebook
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    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    Unser bisheriger Preis:ORGPRICE: 111,03 €

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  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    José Pineda de Gyvez
    Springer US
    Buch
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    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    213,99 €
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